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HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method pictures & photos
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
  • HS 810 Tofd Testing Instrument Developed Based on Ultrasonic Diffraction Time-of-Flight Method
Warranty: 1 Years
Sampling Frequency/Bits: 125MHz/12bits
Sampling Depth: 512/1024 Adjustable
Sound Velocity Range: (300-20000)M/S
Dynamic Range: ≥30dB
Attenuator Accuracy: <1dB/12dB
Customization:

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