| Customization: | Available |
|---|---|
| Warranty: | 1 Years |
| Specification: | 248x180x80mm |
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Integrates A-scan, B-scan imaging, TOFD imaging, guided wave imaging and other functions
Unique synthetic aperture focusing (SAFT) technology
Built-in on-site inspection process model, automatically generates inspection process
Portable scanner and automatic scanning device replace manual scanning to meet various workpiece inspection requirements
A-scan: RF display improves the instrument's ability to evaluate defect patterns in materials
B-scan imaging: Real-time display of defect cross-sectional shape
TOFD scanning imaging: Real-time display of defect grayscale scanning
Figure, intuitively display defects and evaluate defect quality
Multi-channel TOFD detection and PE detection fully cover partition scanning within 200mm thickness, expandable to 400mm thickness
Through wave removal: Special processing tool for near-surface defects to improve the accuracy of near-surface defect analysis
Horizontal and vertical adjustment: to meet different on-site operating habits
SAFT: internationally recognized function to effectively improve defect measurement accuracy
Instrument software: has both SAFT (synthetic aperture focusing) function and differential through-wave straightening function
Offline analysis software: has SAFT (synthetic aperture focusing) processing function, has the same-screen comparison display function before and after image processing, and has the function of directly converting TOFD images into BMP bitmaps
Offline image analysis: restore and replay the A-scan waveform recorded during scanning; statistical analysis of defect size and contour thickness/amplitude data; record conversion to ASCI/MSWOrd/MS Excel format report
| Transmit parameters | |||
| Pulse type | Negative square wave pulse | Pulse width | 40ns-1000ns continuously adjustable (8ns step) |
| Probes that can be connected simultaneously | 10 | Impedance matching | 25Ω,500Ω |
| Pulse front | <10 ns | ||
| Receiving parameters | |||
| Sampling frequency/bits | 125MHz/12bits | Scanning range | Zero interface incidence-14000mm steel longitudinal wave |
| Sampling depth | 512/1024 adjustable | Sound velocity range | (300-20000)m/s |
| Repetition frequency | 100HZ-800Hz adjustable | Dynamic range | ≥30dB |
| Attenuator accuracy | <1dB/12dB | Vertical linear error | ≤3% |
| Horizontal linear error | ≤0.3% | ||
| Comprehensive performance | |||
| Resolution | >30dB | Sensitivity margin | >52dB(Φ2x200mm) |
| Detection method | Full detection, positive detection, negative detection, RF | Waveform Averaging | 1-8 adjustable |
| Imaging mode | A scan, B scan, C scan | Linear scan length | (0-40000) mm Automatic scrolling |
| Instrument parameters | |||
| Overall size | 248x180x80(mm) | Machine weight | 2.4kg (including battery) |
| Display screen size | 6.5'' | Display screen resolution | 640x480 |
| Human-computer interaction | Keyboard, shuttle | SSD | 8 GB |
| Interface | LAN, USB2.0.VGA | Power supply, battery | DC (DC12V/2A), battery 11.1V/6600mAh |
| Working temperature | (-10-40)°C (reference value) | Relative humidity | (20-95)%RH |
| Factory inspection | European standard inspection report provided | ||
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